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Fabrication process and failure analysis for robust quantum dots in silicon
- 详细信息
标题: | Fabrication process and failure analysis for robust quantum dots in silicon |
资源摘要: | Title: Fabrication process and failure analysis for robust quantum dots in silicon Author(s): Dodson, J. P.; Holman, Nathan; Thorgrimsson, Brandur; et al. Source: NANOTECHNOLOGY, 31 (50): DEC 11 2020 Document Type: Article |
资源原始URL | http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Alerting&SrcApp=Alerting&DestApp=WOS&DestLinkType=FullRecord&KeyUT=WOS%3A000576551700001 |
资源来源机构: | web of science |
来源机构所属国家: | America |
来源机构性质: | scitific |