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Fabrication process and failure analysis for robust quantum dots in silicon

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标题: Fabrication process and failure analysis for robust quantum dots in silicon
资源摘要: Title: Fabrication process and failure analysis for robust quantum dots in silicon
Author(s): Dodson, J. P.; Holman, Nathan; Thorgrimsson, Brandur; et al.
Source: NANOTECHNOLOGY, 31 (50): DEC 11 2020
Document Type: Article
资源原始URL http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Alerting&SrcApp=Alerting&DestApp=WOS&DestLinkType=FullRecord&KeyUT=WOS%3A000576551700001
资源来源机构: web of science
来源机构所属国家: America
来源机构性质: scitific

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